O-INSPECT
Having all the necessary options for reliable measurements.
An expert in every discipline
O-INSPECT multisensor measuring machines from ZEISS enable you to optimally measure each characteristic – optically or by contact. An important feature: O-INSPECT delivers reliable 3D accuracy compliant with ISO standards at a temperature range of 18-30°C. An added highlight: CALYPSO software not only delivers results easily, but also simplifies the detection and identification of the causes of errors.

O-INSPECT 322
Measuring range [dm] 3/2/2
Features
- telecentric zoomlens Discovery
- adaptive illumination system
- scanning sensor VAST XXT
- probing rack
- calibration sphere
O-INSPECT 863
Measuring range [dm] 8/6/3
Software
- CALYPSO
O-INSPECT 543
Measuring range [dm] 5/4/3
Options
- white light distance sensor
- rotary table
- loading system with glass pallet and hole grid pallet
- calibration pallet

1 – Scanning sensor ZEISS VAST XXT; 2 – Zoom Lens ZEISS Discovery.V12; 3 – White light distance sensor
Large visual field, high image definition – zoom lens ZEISS Discovery
ZEISS Discovery.V12 comes from the ZEISS Microscopy division. Compared to standard lenses, it provides a 4x larger visual field and very good image definition also in the peripheral zones.
The result: reduced measuring time and excellent accuracy.
More measured points, more information – scanning sensor ZEISS VAST XXT
With the ZEISS VAST XXT, O-INSPECT is equipped with a flexible, fast and highly precise contact sensor. This scanning sensor captures a considerable number of points in a single pass to enable informative statements on form and location. A speciality in this machine class. ZEISS O-INSPECT allows scans with probing forces in the millinewton range in areas where other multisensor measuring machines only permit single-point measurements with relatively high probing forces. This enables true 3D measurements of thin-walled parts.
Quickly and precisely. Seeing and understanding – with ZEISS CALYPSO
Together with ZEISS CALYPSO, ZEISS O-INSPECT opens up entirely new dimensions of visualization. You see the actual status, nominal display and deviations simultaneously, making it particularly easy to properly allocate and interpret the measuring results.